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IEC 60749-36:2003-02

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 36: Gleichmäßiges Beschleunigen
Publication date
2003-02
Original language
English, French
Pages
16
Publication date
2003-02
Original language
English, French
Pages
16

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