Standard
[CURRENT]
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IEC 60749-36:2003-02
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 36: Gleichmäßiges Beschleunigen
- Publication date
-
2003-02
- Original language
-
English,
French
- Pages
- 16
- Publication date
-
2003-02
- Original language
-
English,
French
- Pages
- 16
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