Standard
[CURRENT]
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IEC 60749-28:2022-03
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
- Publication date
-
2022-03
- Original language
-
English,
French
- Pages
- 98
- Publication date
-
2022-03
- Original language
-
English,
French
- Pages
- 98
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