IEC 60749-27:2006-07

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine Model (MM)
Publication date: 2006-07
Original language: English, French
Pages: 25

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Replacement amendments

This document has been modified by: IEC 60749-27 AMD 1:2012-09

Loading recommended items...