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IEC 60749-12:2017-12

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 12: Schwingen, variable Frequenz
Publication date
2017-12
Original language
English, French
Pages
14
Publication date
2017-12
Original language
English, French
Pages
14

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