Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance, unbiased HAST (IEC 60749-24:2004)
German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 24: Beschleunigte Verfahren für Feuchtebeständigkeit - Hochbeschleunigende Wirkung (HAST) ohne elektrische Beanspruchung (IEC 60749-24:2004)
Publication date
2004-04
Original language
English
Publication date
2004-04
Original language
English
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