EN 60749-11:2002-08

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002)

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 11: Rascher Temperaturwechsel; Zweibäderverfahren (IEC 60749-11:2002)
Publication date: 2002-08
Original language: English

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