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The ISO 7503 series of standards provides guidelines for the determination of surface contamination. The standard is applicable to many situations where radioactive contamination may occur. Contamination results from the release of radioactivity in the local environment. In most cases, the release is unintentional, but circumstances may arise in which it is intentional. However, the procedure for measuring the strength and distribution of contamination is usually the same regardless of the circumstances. The standard consists of three parts: Part 1 deals primarily with direct monitoring and provides practical guidelines for measurement. Part 2 covers indirect measurements using various forms of wipe tests. Part 3 describes the calibration of measuring instruments used for surface contamination monitoring and describes a more rigorous approach to quantitative determination of contamination levels. This Part 2 of the standard addresses the determination of surface contamination by indirect measurement using a wipe test. This procedure introduces additional uncertainty because the method is based on the estimation of the removal factor of the activity. The determined activity depends on the estimate of the activity taken from the surface. The responsible committee is DKE/GUK 967.2 "Aktivitätsmessgeräte für den Strahlenschutz" ("Radiation protection instrumentation") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.
This document replaces DIN ISO 7503-1:1990-07 , DIN ISO 7503-2:1990-07 .