Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005); German version EN ISO 18452:2016
German title
Hochleistungskeramik - Bestimmung der Dicke keramischer Schichten mit einem Kontaktprofilometer (ISO 18452:2005); Deutsche Fassung EN ISO 18452:2016
Publication date
2016-09
Original language
German
Pages
15
Publication date
2016-09
Original language
German
Pages
15
DOI
https://dx.doi.org/10.31030/2482917
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Overview
This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm. The text of ISO 18452:2005 has been prepared by Technical Committee ISO/TC 206 "Fine ceramics" of the International Organization for Standardization (ISO) and adopted as EN ISO 18452:2016 by CEN/TC 184 "Advanced technical ceramics", the secretariat of which is held by DIN (Germany). There is no DIN working committee for DIN EN ISO 18452, as no interest in this standardization topic has been expressed by the German technical public.
Please get in touch with the relevant contact person at DIN if you have problems understanding the content of the standard or need advice on how to apply it.