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Standard [WITHDRAWN]

DIN EN ISO 11665-2:2015-11

VDE 0493-1-6652:2015-11

Measurement of radioactivity in the environment - Air: radon-222 - Part 2: Integrated measurement method for determining average potential alpha energy concentration of its short-lived decay products (ISO 11665-2:2012); German version EN ISO 11665-2:2015

German title
Ermittlung der Radioaktivität in der Umwelt - Luft: Radon-222 - Teil 2: Integrierendes Messverfahren für die Bestimmung des Durchschnittswertes der potenziellen Alpha-Energiekonzentration der kurzlebigen Radon-Folgeprodukte (ISO 11665-2:2012); Deutsche Fassung EN ISO 11665-2:2015
Publication date
2015-11
Original language
German
Pages
20

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Publication date
2015-11
Original language
German
Pages
20

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Overview

Radon is today considered to be the main source of human exposure to natural radiation. The UNSCEAR (2006) report suggests that, at the worldwide level, radon accounts for around 52 % of global average exposure to natural radiation. The radiological impact of isotope 222 (48 %) is far more significant than isotope 220 (4 %), while isotope 219 is considered negligible. Exposure to radon and its decay products varies tremendously from one area to another. It depends firstly on the amount of radon emitted by the soil and, secondly, on the degree of containment and weather conditions in the areas where exposure takes place. This part of the DIN ISO 11665 series exclusively covers integrated measurement methods for short-lived radon-222 decay products. It gives indications for measuring the average potential alpha energy concentration of short-lived radon-222 decay products in air, and the conditions of use for the measuring devices. The standard includes samples taken over periods varying from a few weeks to one year. This standard does not cover a measuring system with a maximum sampling duration of less than a week. The responsible committee is GUK 967.2 "Aktivitätsmessgeräte für den Strahlenschutz" ("Activity measuring instruments for radiation protection") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.

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