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Standard [PRE-ORDER]

DIN EN IEC 63364-1:2025-01

Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection (IEC 63364-1:2022); German version EN IEC 63364-1:2023

German title
Halbleiterbauelemente - Halbleiterbauelemente für IoT-Systeme - Teil 1: Prüfverfahren für die Erkennung von Schallschwankungen (IEC 63364-1:2022); Deutsche Fassung EN IEC 63364-1:2023
Publication date
2025-01
Original language
German
Pages
14

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Publication date
2025-01
Original language
German
Pages
14
DOI
https://dx.doi.org/10.31030/3576061

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/3576061

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