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Draft standard

DIN EN IEC 63364-1:2023-10 - Draft

Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (IEC 47/2742/CDV:2021); German and English version prEN IEC 63364-1:2021

German title
Halbleiterbauelemente - Halbleiterbauelemente für IOT-Systeme - Teil 1: Prüfverfahren für die Erkennung von Schallschwankungen (IEC 47/2742/CDV:2021); Deutsche und Englische Fassung prEN IEC 63364-1:2021
Date of issue
2023-09-29
Publication date
2023-10
Information

  • To be withdrawn in 2025-01 and replaced by: DIN EN IEC 63364-1, edition:2025-01

Original language
German, English
Pages
22

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Date of issue
2023-09-29
Publication date
2023-10
Information

  • To be withdrawn in 2025-01 and replaced by: DIN EN IEC 63364-1, edition:2025-01

Original language
German, English
Pages
22
DOI
https://dx.doi.org/10.31030/3488014

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/3488014

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