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Standard [CURRENT]

DIN EN IEC 60749-13:2018-10

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018); German version EN IEC 60749-13:2018

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 13: Salzatmosphäre (IEC 60749-13:2018); Deutsche Fassung EN IEC 60749-13:2018
Publication date
2018-10
Original language
German
Pages
15

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Publication date
2018-10
Original language
German
Pages
15
DOI
https://dx.doi.org/10.31030/2869253

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/2869253
Replacement amendments

This document replaces DIN EN 60749-13:2003-04 .

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