DIN EN 62631-3-3:2016-10

The IEC 62631 series of standards is divided into four superordinate parts, which in turn are further subdivided into various groups. Within Part 1 of IEC 62631 general aspects are considered which concern the measurement of dielectric and resistive properties of solid electrical insulating materials. Parts 2 and 3 describe the basic procedures for measuring dielectric and resistive properties by DC and AC methods. Part 4 deals with special measurement methods and procedures for calculation. The measured values of the dielectric and resistive properties of solid insulating materials depend on various factors, such as the magnitude and time duration of the applied voltage, the frequency, the nature and geometry of the electrodes, the surface condition, impurities, the temperature and humidity of the surrounding atmosphere as well as of the test specimens during conditioning and measurement, and in some cases also on the electric field strength. Therefore, the electrical and dielectric properties dealt with in the IEC 62631 series of standards are comparable only insofar as the boundary conditions are specified with respect to the parameters entering into the measurement. The shape and dimensions of the test specimens - as well as the measurement parameters - shall be defined in product standards or in the relevant parts of the series of standards presented here, which describe the test procedures. This is to be done depending on the requirements that have to be taken into account in order to meet the respective requirements of a measurement. Appropriate care is required when the design of products relies on measured values determined in accordance with the IEC 62631 series of standards. This Part 3-3 contains guidelines for the determination of insulation resistance. The responsible committee is DKE/K 183 "Bewertung und Qualifizierung von elektronischen Isolierstoffen und Isoliersystemen" ("Evaluation and qualification of electrical insulating materials and systems ") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.