DIN EN 61788-17:2013-11

This part of IEC 61788 describes the measurements of the local critical current density and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields, the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of the current density and the film thickness d. The range and measurement resolution for current density and film thickness of HTS films are as follows: the product of current density and film thickness: from 200 A/m to 32 kA/m (based on results, no limitation); - measurement resolution: 100 A/m (based on results, no limitation) The responsible committee is DKE/K 184 "Supraleiter" ("Superconductors") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.