DIN EN 61709:2012-01

This International Standard gives guidance on how failure rate data can be employed for reliability prediction of electric components in equipment. Reference conditions are numerical values of stresses that are typically observed by components in the majority of applications. Reference conditions are useful since they are the basis of the calculation of failure rate under any conditions by the application of stress models that take into account the actual operating conditions. Failure rates stated at reference conditions allow realistic reliability predictions to be made in the early design phase. The stress models described in this standard are generic and can, when needed, be used as a basis for conversion of the failure rate data at these reference conditions to actual operating conditions. This simplifies the prediction approach. Conversion of failure rate data is only permissible within the specified functional limits of the components. This standard also gives guidance on how a database of component failure data can be constructed to provide failure rates that can be used with the included stress models. Reference conditions are specified, so that data from different sources can be compared on a uniform basis. If failure rate data are given in accordance with this International Standard then no additional information on the specified conditions is required. This standard does not provide base failure rates for components - rather it provides models that allow failure rates obtained by other means to be converted from one operating condition to another operating condition. The prediction methodology described in this standard assumes that the parts are being used within its useful life. The methods in this standard have a general application but are specifically applied to a selection of component types as defined in clause 6 and clause E.2. The responsible committee is K 132 "Zuverlässigkeit" ("Reliability") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.