DIN EN 60794-1-22:2013-01

This part of the DIN EN 60794 series specifies requirements for the environmental stress resistance of optical cables by the specification of suitable test methods. Consequently it replaces the clauses of DIN EN 60794-1-22:2004 dealing with environmental tests. The first edition of DIN EN 60794-1-22 contains the following methods: - Temperature cycling (Method F1) serves for the verification of stability of the attenuation of cables submitted to temperature changes. - Water penetration (Method F5) verifies the protection of cables against penetrating water. - Method F7 checks the effect of nuclear radiation on the physical property of cables. - Method F8 verifies the pneumatic resistance for unfilled cables protected by gas pressurization. - Ageing (method F9) serves for verification of the behaviour of the physical characteristics over the service life of optical cables. - Method 10 checks the underwater cable resistance to hydrostatic pressure. - Method 11 serves for the measurement of sheath shrinkage by ageing of LWL simplex and duplex cables in cables intended for patch cords. - Method F12 is the temperature cycling of cables used for patch cords. - Method F13 serves for the microduct pressure-withstand. - The cable UV resistance test (Method F14) evaluates the stress resistance of the sheath materials against ultraviolet radiation by sun light or fluorescent light. - Method F15 determines the ability of cables to withstand the influence of freezing water immediately surrounding the cables. - The visual check of the colour permanence is briefly explained in informative Annex A. This International Standard applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables comprising a combination of both optical fibres and electrical conductors. The responsible committee is Subcommittee DKE/UK 412.6 "Lichtwellenleiter und Lichtwellenleiterkabel" ("Fibres and cables") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.