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Standard [CURRENT]

DIN EN 60749-33:2004-09

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33:2004); German version EN 60749-33:2004

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 33: Beschleunigte Verfahren für Feuchtebeständigkeit - Autoclave ohne elektrische Beanspruchung (IEC 60749-33:2004); Deutsche Fassung EN 60749-33:2004
Publication date
2004-09
Original language
German
Pages
10

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Publication date
2004-09
Original language
German
Pages
10
DOI
https://dx.doi.org/10.31030/9569226

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/9569226

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