We use cookies to make our websites more user-friendly and to continuously improve them. If you continue to use the website, you consent to the use of cookies. You can find more information in our privacy statement and our cookie guidelines.

Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [CURRENT]

DIN EN 60749-32:2011-01

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002 + Cor. :2003 + A1:2010); German version EN 60749-32:2003 + Cor. :2003 + A1:2010

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 32: Entflammbarkeit von Bauelementen in Kunststoffgehäusen (Fremdentzündung) (IEC 60749-32:2002 + Cor. :2003 + A1:2010); Deutsche Fassung EN 60749-32:2003 + Cor. :2003 + A1:2010
Publication date
2011-01
Original language
German
Pages
8

from 56.60 EUR VAT included

from 52.90 EUR VAT excluded

Format and language options

PDF download

  • 56.60 EUR

Shipment (3-5 working days)

  • 68.30 EUR

Monitor with the Standards Ticker

This option is only available after login.
Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Publication date
2011-01
Original language
German
Pages
8
DOI
https://dx.doi.org/10.31030/1733325

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Overview

This test method is applicable to all semiconductor devices (discrete semiconductor devices and integrated circuits) and is intended to determine flammability of semiconductor devices due to external heating. By incorporating the amendment, the dated reference for the test standard to be applied has been updated to read IEC 60695-11-5:2005. The responsible Committee is K 631 "Halbleiterbauelemente" ("Semiconductor devices") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.

ICS
13.220.40, 31.080.01
DOI
https://dx.doi.org/10.31030/1733325
Replacement amendments

This document replaces DIN EN 60749-32:2003-12 .

Cooperation at DIN

Relationship to other standards
This document references:
Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...