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Standard [WITHDRAWN]

DIN EN 60749-18:2003-09

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2002); German version EN 60749-18:2003

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 18: Ionisierende Strahlung (Gesamtdosis) (IEC 60749-18:2002); Deutsche Fassung EN 60749-18:2003
Publication date
2003-09
Original language
German
Pages
15
Note
The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.

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Publication date
2003-09
Original language
German
Pages
15
Note
The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.
DOI
https://dx.doi.org/10.31030/9503387

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/9503387
Replacement amendments

This document has been replaced by: DIN EN IEC 60749-18:2020-02 .

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