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This International Standard has been prepared by IEC/TC 62/SC 62B "Diagnostic imaging equipment" with the German collaboration of Joint Committee NAR-DKE NA 080-00-016 GA "Bildgebende Systeme" ("Imaging systems"). This standard deals with the definitions, determination and indication of anti-scatter grids used in diagnostic X-ray imaging equipment in order to reduce the incidence of scattered radiation, produced particularly in the body of the patient, upon the image reception area and thus to improve the contrast of the X-ray pattern. In this standard only linear grids are considered. Since at present only focused grids are used in mammography, this standard is restricted to focused grids where mammographic anti-scatter grids are concerned. This standard is intended to be applied for the determination of the characteristics of anti-scatter grids under test conditions. These conditions are not usually available at the site of the responsible organization. The reason for the present revision of the second edition of the standard was the fact that calcium tungstate phosphor fluorescent screens are obsolete and no longer available. Today, the test setup for measuring primary radiolucency, scattered radiolucency, and total radiolucency is performed with gadolinium oxysulphide (GOS) fluorescent screens. Further, a new quality parameter is introduced which better describes the properties of the anti-scatter grid, especially for digital detector applications. Working Committee NA 080-00-16 GA NAR/DKE Joint Committee "Bildgebende Systeme" ("Imaging systems") of DIN Standards Committee Radiology (NAR) in collaboration with Deutsche Röntgengesellschaft (German Radiological Society) and in cooperation with DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE is responsible for this standard.
This document replaces DIN EN 60627:2006-03 .