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Standard [CURRENT]
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This standard applies to connectors for electrical and electronic applications. It specifies a test method for determining the value of r.f. shunt resistance which degrades the Q-factor of an L/C circuit when a component is connected in parallel. The responsible Committee is K 651 "Steckverbinder" ("Connectors") of the DKE (German Commission for Electrical, Electronic and Information Technologies) of DIN and VDE.
This document partially replaces DIN IEC 60512-9:1994-05 .