DIN EN 60384-8:2015-12

This standard specifies the preferred rated values and characteristics for ceramic fixed capacitors, selects the appropriate quality assessment procedures, tests and measurement methods from IEC 60384-1 and specifies general requirements for the operating behaviour. In detail specifications that refer to this sectional specification, the severity of tests and requirements shall be at least as stringent as those defined in this specification; less severe tests and requirements are not permitted. This part of IEC 60384 is applicable to fixed capacitors of ceramic dielectric with a defined temperature coefficient (dielectric Class 1), intended for use in electronic equipment, including leadless capacitors but excluding fixed surface mount multilayer capacitors of ceramic dielectric, which are covered by IEC 60384-21 (Class 1). Capacitors for electromagnetic interference suppression are not included, but are covered by IEC 60384-14. The preferred ratings and characteristics are explained in the preferred characteristics and preferred ratings clause. For the preferred climate categories, the capacitors in this specification are classified into climate categories according to the general rules in IEC 60068-1. For capacitors according to this specification the rated temperature is equal to the upper category temperature. The quality assessment procedures clause explains the primary manufacturing stage, structurally similar components, confirmed test reports for approved lots and qualification approval. For single-layer capacitors, the primary manufacturing stage is the metallization of the dielectric to form the electrodes; for multi-layer capacitors, it is the first joint firing of electrodes and ceramic bodies. Capacitors are described as structurally similar if they are manufactured according to similar manufacturing processes and from similar materials, even if their package sizes and values are different. For the confirmed test reports on approved lots, the information required by IEC 60384-1 shall be provided if this is stipulated in the detail specification and requested by the customer. Of the values determined after the endurance test, these shall be stated on request: capacitance change, dissipation factor and insulation resistance. The procedures for qualification approval tests are given in IEC 60384-1. The test plan to be applied according to the procedure of batch and periodic tests for qualification approval is given in this specification. Tests shall be performed on a lot-by-lot basis when forming test lots of the tests of groups A and B. The manufacturer may assemble inspection lots from current production, subject to the following precautions. The inspection lot shall consist of capacitors of similar construction. For group A, the random sample to be tested must represent all values and dimensions occurring in the inspection lot, in accordance with their number and with at least 5 test specimens per value. For group B2, the sample shall include capacitors for all temperature coefficients that occur in the lot. If the sample contains less than 5 pieces of each value, the random sampling shall be agreed between the manufacturer and the certification body. For group C tests, the tests shall be carried out periodically. The random samples shall represent the current production of the specified periods and shall be divided into small, medium and large capacity values. In further periods other rated voltages and/or capacitance values from current production shall be tested so that the entire range is ultimately covered. The clause on test and measurement procedures describes the visual inspection and checking of dimensions, the electrical tests, the temperature coefficient of the capacitance and capacitance drift with temperature change, the resistance of the connections, the resistance to soldering heat and solderability, rapid temperature change, as well as oscillation, bumping and shock. The responsible committee is DKE/K 611 "Kondensatoren" ("Condensers") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.