Standard [WITHDRAWN]
DIN EN 16424:2015-01
Characterization of waste - Screening methods for the element composition by portable X-ray fluorescence instruments; German version EN 16424:2014
- German title
- Charakterisierung von Abfällen - Screening-Verfahren zur Bestimmung der elementaren Zusammensetzung mit tragbaren Röntgenfluoreszenzspektrometern; Deutsche Fassung EN 16424:2014
- Publication date
- 2015-01
- Original language
- German
- Pages
- 34
- Publication date
- 2015-01
- Original language
- German
- Pages
- 34
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X-ray fluorescence spectrometry (XRF) is a fast and reliable method for determining the total content of certain elements within different matrices. Quantitative analysis using XRF is described in EN 15309. DIN EN 16424 is intended for portable XRF spectrometers (XRF devices) (hand-held or portable bench top devices) for field use and describes a screening method for determining the elementary composition of wastes during in-situ analysis. Portable XRF spectrometers are used for a rapid and exploratory analysis of liquid, paste-like or solid materials. The absence or presence of specific elements is displayed qualitatively in the form of negative and positive results with a guideline value for the concentration. This standard shall be regarded in connection with CEN/TR 16130 and is an exemplification of EN 16123.
This document has been replaced by: DIN EN 16424:2015-03 .