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Standard [WITHDRAWN]

DIN 51096:2008-07

Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) and electrothermal vaporisation (ETV)

German title
Prüfung keramischer Roh- und Werkstoffe - Direkte Bestimmung der Massenanteile von Spurenverunreinigungen in pulver- und kornförmigem Siliciumcarbid mittels optischer Emissionsspektrometrie mit induktiv gekoppeltem Plasma (ICP OES) und elektrothermischer Verdampfung (ETV)
Publication date
2008-07
Original language
German
Pages
26

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Publication date
2008-07
Original language
German
Pages
26

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Content
ICS
81.060.10
Replacement amendments

This document has been replaced by: DIN EN 15991:2011-04 .

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