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Standard [WITHDRAWN]

DIN 50453-1:1990-10

Testing of materials for semiconductor technology; determination of etch rates of etching mixtures; silicium monocrystals; gravimetric method

German title
Prüfung von Materialien für die Halbleitertechnologie; Bestimmung der Ätzraten von Ätzmischungen; Silicium-Einkristalle; Gravimetrisches Verfahren
Publication date
1990-10
Original language
German
Pages
3

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Publication date
1990-10
Original language
German
Pages
3
DOI
https://dx.doi.org/10.31030/2380716

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ICS
29.045
DOI
https://dx.doi.org/10.31030/2380716
Replacement amendments

This document has been replaced by: DIN 50453-1:2023-08 .

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