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Standards Worldwide
Standards Worldwide
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Standard [CURRENT]

BS EN IEC 60749-5:2024-02-06

Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test

German title
Halbleiterbauelemente. Mechanische und klimatische Prüfverfahren Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung
Publication date
2024-02-06
Original language
English
Pages
14

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Publication date
2024-02-06
Original language
English
Pages
14

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