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Standards Worldwide
Standards Worldwide
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Draft standard

OVE EN IEC 60749-28:2021-01-01 - Draft

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 47/2661/CDV) (english version)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level (IEC 47/2661/CDV) (englische Fassung)
Publication date
2021-01-01
Original language
English
Pages
52

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Publication date
2021-01-01
Original language
English
Pages
52

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