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Draft standard

OEVE/OENORM EN 60749-28:2013-04-15 - Draft

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM) (IEC 47/2155/CDV)

Publication date
2013-04-15
Original language
English
Pages
24

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Publication date
2013-04-15
Original language
English
Pages
24

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