Standard
[CURRENT]
XP X06-066:2005-10-01
XP ISO/TS 21749:2005-10-01
Measurement and uncertainty for metrological applications - Repeated measurements and nested experiments
- German title
- Messunsicherheit für metrologische Anwendungen - Einfache Wiederholung und geschachtelte Versuche
- Publication date
-
2005-10-01
- Original language
-
English
- Pages
- 47
- Publication date
-
2005-10-01
- Original language
-
English
- Pages
- 47
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