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Standard [CURRENT]

UNE-EN 62374-1:2011-03-01

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)

Publication date
2011-03-01
Original language
English
Pages
16

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Publication date
2011-03-01
Original language
English
Pages
16

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