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Standard [CURRENT]

UNE-EN 60749-44:2016-12-01

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)

Publication date
2016-12-01
Original language
English
Pages
21

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Publication date
2016-12-01
Original language
English
Pages
21

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