Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006). (Endorsed by AENOR in November of 2006.)
Publication date
2006-11-01
Original language
English
Pages
10
Publication date
2006-11-01
Original language
English
Pages
10
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