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Standard [CURRENT]

UNE-EN 15991:2016-01-01

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in January of 2016.)

Publication date
2016-01-01
Original language
English
Pages
25

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Publication date
2016-01-01
Original language
English
Pages
25

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