Standard
[CURRENT]
SN EN 62374-1:2010-11
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
- German title
- Halbleiterbauelemente - Teil 1: Prüfung auf zeitabhängigen dielektrischen Durchbruch (TDDB) bei Isolationsschichten zwischen metallischen Leiterbahnen
- Publication date
-
2010-11
- Original language
-
English
- Pages
- 2
- Publication date
-
2010-11
- Original language
-
English
- Pages
- 2
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