Standard
[CURRENT]
SN EN 62047-2:2006-09
Semiconductor devices - Micro-electromechanical devices. Part 2: Tensile testing methods of thin film materials
- German title
- Halbleiterbauelemente - Bauteile der Mikrosystemtechnik. Teil 2: Prüfverfahren zur Zugbeanspruchung bei Dünnschicht-Werkstoffen
- Publication date
-
2006-09
- Original language
-
German
- Pages
- 12
- Publication date
-
2006-09
- Original language
-
German
- Pages
- 12
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