Standard
[CURRENT]
SN EN 60749-6:2017-06
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 6: Lagerung bei hoher Temperatur
- Publication date
-
2017-06
- Original language
-
German
- Pages
- 7
- Publication date
-
2017-06
- Original language
-
German
- Pages
- 7
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