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Standards Worldwide
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Standard [CURRENT]

SN EN 60749-4:2017-06

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 4: Feuchte Wärme, konstant, Prüfung mit hochbeschleunigter Wirkung (HAST)
Publication date
2017-06
Original language
German
Pages
10

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Publication date
2017-06
Original language
German
Pages
10

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