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Standard [CURRENT]

OVE EN 60749-44:2017-05-01

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices ( IEC 60749-44:2016) (german version)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 44: Prüfverfahren zur Einzelereignis-Effekt-Neutronenbestrahlung von Halbleiterbauelementen ( IEC 60749-44:2016) (deutsche Fassung)
Publication date
2017-05-01
Original language
German
Pages
24

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Publication date
2017-05-01
Original language
German
Pages
24

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