We use cookies to make our websites more user-friendly and to continuously improve them. If you continue to use the website, you consent to the use of cookies. You can find more information in our privacy statement and our cookie guidelines.

Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [CURRENT]

OVE EN 60749-4:2017-12-01

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017) (german version)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 4: Feuchte Wärme, konstant, Prüfung mit hochbeschleunigter Wirkung (HAST) (IEC 60749-4:2017) (deutsche Fassung)
Publication date
2017-12-01
Original language
German
Pages
14

Please select

from 86.54 EUR VAT included

from 80.88 EUR VAT excluded

Purchasing options

PDF download

  • 86.54 EUR

Shipment (3-5 working days)

  • 97.26 EUR

Standards Ticker 1
1

Learn more about the standards ticker

Publication date
2017-12-01
Original language
German
Pages
14

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...