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Standards Worldwide
Standards Worldwide
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Standard [CURRENT]

OVE EN 60749-28:2018-03-01

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017) (german version)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level (IEC 60749-28:2017) (deutsche Fassung)
Publication date
2018-03-01
Original language
German
Pages
50

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Publication date
2018-03-01
Original language
German
Pages
50

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