Standard
[CURRENT]
OEVE/OENORM EN 62374:2008-03-01
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007)
- German title
- Halbleiterbauelemente - Prüfung des zeitabhängigen dielektrischen Durchbruchs (TDDB) für dielektrische Gate-Schichten (IEC 62374:2007)
- Publication date
-
2008-03-01
- Original language
-
German
- Pages
- 24
- Publication date
-
2008-03-01
- Original language
-
German
- Pages
- 24
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