Standard
[CURRENT]
OEVE/OENORM EN 60749+A1+A2:2002-11-01
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000 + A2:2001)
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren (IEC 60749:1996 + A1:2000 + A2:2001)
- Publication date
-
2002-11-01
- Original language
-
German
- Pages
- 74
- Publication date
-
2002-11-01
- Original language
-
German
- Pages
- 74
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