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Standards Worldwide
Standards Worldwide
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Standard [CURRENT]

OEVE/OENORM EN 60749-35:2007-04-01

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 35: Ultraschallmikroskopie für kunststoffverkappte Bauelemente der Elektronik (IEC 60749-35:2006)
Publication date
2007-04-01
Original language
German
Pages
21

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Publication date
2007-04-01
Original language
German
Pages
21

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