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Standards Worldwide
Standards Worldwide
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Standard [CURRENT]

OEVE/OENORM EN 60749-27:2013-07-01

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006 + A1:2012) (german version)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine Model (MM) (IEC 60749-27:2006 + A1:2012) (deutsche Fassung)
Publication date
2013-07-01
Original language
German
Pages
15

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Publication date
2013-07-01
Original language
German
Pages
15

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