Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004 + A1:2011) (german version)
German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur (IEC 60749-23:2004 + A1:2011) (deutsche Fassung)
Publication date
2011-09-01
Original language
German
Pages
11
Publication date
2011-09-01
Original language
German
Pages
11
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