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Standards Worldwide
Standards Worldwide
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Standard [CURRENT]

OEVE/OENORM EN 60749-2:2003-10-01

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 2: Niedriger Luftdruck (IEC 60749-2:2002)
Publication date
2003-10-01
Original language
German
Pages
8

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Publication date
2003-10-01
Original language
German
Pages
8

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