We use cookies to make our websites more user-friendly and to continuously improve them. If you continue to use the website, you consent to the use of cookies. You can find more information in our privacy statement and our cookie guidelines.

Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [CURRENT]

NF X21-066:2009-06-01

NF ISO 23812:2009-06-01

Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials

German title
Chemische Flächenanalyse - Sekundärionenmassenspektrometrie - Verfahren zur Tiefenkalibrierung für Silicium mit Mehrfach-Delta-Schicht-Bezugswerkstoffen
Publication date
2009-06-01
Original language
French
Pages
25

Please select

from 77.20 EUR VAT included

from 72.15 EUR VAT excluded

Purchasing options

PDF download

  • 77.20 EUR

  • 77.20 EUR

Shipment (3-5 working days)

  • 86.60 EUR

  • 86.60 EUR

Standards Ticker 1
1

Learn more about the standards ticker

Publication date
2009-06-01
Original language
French
Pages
25

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Loading recommended items...
Loading recommended items...
Loading recommended items...