Semiconductor devices - Micro-electromechanical devices - Part 8: strip bending test method for tensile property measurement of thin films
German title
Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 8: Streifen-Biege-Prüfverfahren zur Messung von Zugbeanspruchungsmerkmalen dünner Schichten
Publication date
2011-10-01
Original language
French
Pages
21
Publication date
2011-10-01
Original language
French
Pages
21
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