Standard
[CURRENT]
NF C96-050-3:2006-11-01
NF EN 62047-3:2006-11-01
Semiconductor devices - Micro-electromechanical devices - Part 3: thin film standard test piece for tensile testing
- German title
- Halbleiterbauelemente - Bauteile der Mikrosystemtechnik - Teil 3: Dünnschicht-Standardmikroprobe für die Prüfung der Zugbeanspruchung
- Publication date
-
2006-11-01
- Original language
-
French
- Pages
- 10
- Publication date
-
2006-11-01
- Original language
-
French
- Pages
- 10
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