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Standard [CURRENT]

NF C96-022-6:2017-06-16

NF EN 60749-6:2017-06-16

Semiconductor devices - Mechanical and climatic test methods - Part 6: storage at high temperature

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 6: Lagerung bei hoher Temperatur
Publication date
2017-06-16
Original language
French
Pages
11

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Publication date
2017-06-16
Original language
French
Pages
11

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